CINDAS MPMD
The Microelectronics Packaging Materials Database (MPMD)
contains data on thermal, mechanical, electrical and
physical properties of electronics packaging
materials. This database which contains properties of
over 750 materials and contains over 15,000 data
curves was developed under the sponsorship of the
Semiconductor Research Corporation. The database is
searchable by material group, material name, property
group, property name and independent variable. For all
data curves, the material composition, experimental
conditions, raw or smoothed data, and references are
given. These references may be to published
literature, theses, or technical and laboratory
reports. Dynamic graphing capabilities allow users to
compare the same property of multiple materials or the
same material under different conditions, as well as
change the ranges on the graph axes.
The
database is produced by CINDAS LLC. For more than 45
years, the Center for Information and Numerical Data
Analysis and Synthesis (CINDAS) at Purdue University
has managed a comprehensive and systematic research
program on the properties and behavior of materials.
This research program involves basic and applied
research, using both experimental techniques and data
from relevant worldwide scientific and technical
literature. The end result is the compilation,
critical evaluation, correlation, and synthesis of
both existing and new experimental data to produce
reliable reference data (recommended values), as well
as the generation of estimated values to fill data
gaps. CINDAS also produces a "companion" database to
MPMD: the Thermophysical Properties of Matter
Databases (TPMD).
On CSA
Illumina, MPMD can be searched as a stand alone file
or, alternatively, it can be accessed via a search of
CSA databases that contain related materials science
records, such as the CSA Technology Research Database.
Major Material Groups Covered
- Elements
- Metal Alloys
- Solders - Leaded
- Solders - Lead Free
- Intermetallics,
Miscellaneous
- Intermetallics,
Aluminides
- Intermetallics,
Beryllides
- Intermetallics,
Silicides
- Ceramics - Oxides
- Ceramics - High K
Oxides
- Ceramics - Nitrides,
Silicides, Carbides,...
- Molding Compounds
- Encapsulants and
Underfill Materials
- Adhesives
- Coating and Unfilled
Epoxies
- Polymers -
Polyimides
- Polymers - Others
- Composites - Thermal
Management
- Composites -
Laminates
- Semiconductors
- Liquids & Gases
Properties Covered in the
MPMD
Thermophysical
Properties:
- Coefficient of
Thermal Expansion
- Coefficient of
Thermal Expansion (Z)
- Contact Angle
- Cross-Linking
Density
- Cure Degree
- Cure Temperature
- Curie Temperature
- Density
- Glass transition
Temp (Master Curve)
- Glass Transition
Temperature
- Interfacial Tension
- Liquide Temperature
- Mean Coeff. of
Thermal Expansion
- Mean Coeff. of
Thermal Expansion (Z)
- Molar Heat capacity
- Reflectance
- Relative Density
- Softening
Temperature
- Solidus Temperature
- Specific Heat
Capacity
- Surface Tension
- Thermal Conductivity
- Thermal Conductivity
Film
- Thermal expansion
- Thermal Expansion
(Z)
- Thermal Expansion
Percent
- Thermal Impedance
- Thermal Resistance
- Thermal Resistance
Junction – Heat Sink
- Viscosity
Electrical
Properties:
- Attenuation
- Coefficient of
Electrical Resistivity
- Dielectric Constant
- Dielectric Loss
Index
- Dissipation Factor
- Electrical
Conductivity
- Electrical
Resistivity
- Electrical
Resistivity, Film
- Electrical
Resistivity, ohm m
- Insulation
Resistance
- Leekage Conductance
- Permittivity
- Piezoelectric
Constant
- Piezoresistance
Coefficient
- Relative Electrical
Resistance
- Seebeck Coefficient
- Surface Resistivity
- Volume Resistivity
Mechanical
Properties – Modulus:
- Bulk ModulusGPa
- Bulk Modulus, MPa
- Compressive Modulus,
GPa
- Compressive Modulus,
MPA
- Dynamic Shear
Modulus
- Dynamic Young’s
Modulus
- Elastic Modulus
(out-of-Plane)
- Flexural Modulus
- Flexural Modulus,
MPa
- Loss Modulus
- Relaxation Modulus
- Relaxation Modulus
(master Curve)
- Young’s Modulus, GPa
- Young’s Modulus, MPa
Mechanical
Properties – Strength:
- Bend Strength
- Biaxial Flexural
Strength, Ultimate
- Compressive
Strength, Yield
- Die Shear Strength
- Flexural Strength
- Fracture Strength
- Lap Shear Strength
- Shear Strength
- Shear Strength,
Yield
- Tensile Strength,
Break
- Tensile Strength,
Ultimate
- Tensile Strength,
Yield
- Yield Strength,
Flexural
Mechanical
Properties – Stress:
- Biaxial Stress
- Biaxial Stress,
Yield
- Compressive Lower
Yield Stress
- Compressive Stress
- Compressive Stress,
True
- Critical Resolved
Shear Stress
- Cure Stress
- Elastic Flexural
Limit
- Film Stress
- Flexural Stress
- Flow Stress
- Residual Stress
- Shear Stress
- Stress Relaxation
- Tensile Stress
- Tensile Stress, True
- Tensile Upper Yield
Stress
- Thermal Stress
- Transverse Rupture
Stress
Mechanical
Properties – Hardness:
- Brinell hardness
- Knoop Hardness
- Microhardness
- Rockwell A Hardness
- Rockwell hardness
- Shore hardness
- Vickers Hardness
- Vickers Hardness, HV
Mechanical
Properties – Fatigue:
- Fatigue Life
- Fatigue Stress
- Fatigue, Bend Strain
Range
- Fatigue, Load Drop
- Fatigue, Maximum
Stress
- Fatigue Shear Strain
Range
- Fatique Shear Stress
Range
- Fatigue, Stress
Amplitude
- Fatigue, Stress
Amplitude Change
- Plastic Strain Range
Mechanical
Properties – Creep:
- Compressive Creep
Strain, True
- Creep Compliance
- Creep Life
- Creep Plastic Strain
- Creep Rate,
Compressive
- Creep Rate, Flexural
- Creep Rate Tensile
- Creep Strain
- Creep Strain Rate
- Creep Strain Rate,
True
- Creep Strain,
Compressive
- Creep Strain,
Tensile
- Creep Strrain, True
- Creep Strength,
Tensile
- Creep, Applied
Stress
- Creep, Normalized
Shear Strain Rate
Optical Properties:
- Absorbance
- Birefringence
- Extiction
Coefficient
- Normal Spectral
Emissivity
- Normal Total
Emissivity
- Refractive Index
Mechanical
Properties – Other:
- Adhesion
- Adhesion Strength
- Biaxial Strain
- Burst Pressure
- Compressibility
- Compressive Plastic
Deformation
- Compressive Strain
- Compressive Strain
at Fracture
- Crack Growth rate
- Crack Growth Rate (da/dn)
- Crack Length
- Elongation
- Elongation at Break
- Elongation at Yield
- Film Strain
- Flexural Strain at
Fracture
- Fracture Energy
- Fracture Toughness,
K(lc)
- Impact Energy
- Load
- Loss tangent (tan
delete)
- Mechanical Loss
Factor
- Normal Strain
- Peel Strain
- Plastic Strain
- Plastic Strain at
Fracture
- Poisson’s Ratio
- Reduction of Area
- Relaxation, Stress
Remaining
Other Properties:
- Activation Enthalpy
- Coefficient of
Friction
- Composition
- Corrosion Mass Loss
- Cure Schedule
- Cure Time
- Diffusion Distance
- Diffusion Energy,
Grain Boundary
- Dissolution of
Nickel
- EMMI Spiral Flow
- Failure Probability
- Film Thickness
- Film Thickness
Retention
- Flow Time
- Gel Time
- Grain Size
- Intermetallic Grain
Radius
- Intermetallic Grains
Density
- Intermetallic
Thickness
- Intermetallic Total
Grains Volume
- Lifetime
- Linear Shrinkage
- Linear Swelling
- Mass Diffusion
Coefficient
- Moisture Content
- Molding Time
- Oxidation Rate
- Oxide Thickness
- Pore Size
Size:
15,000+ data curves
(as of June 2006)
Update Frequency:
Dates of Coverage:
Supplier
CINDAS LLC
P.O. Box 3814
West Lafayette, IN 47996-3814
USA
Voice: 800 696 7549 (in N. America)
Voice: +1 765 746 2039 (worldwide)
Field Codes
| IA = Independent
Variable |
| MG = Material
Group |
| ML = Material |
| PP = Property |
| PZ = Property
Group |
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